Bruker ELIO Portable Micro-XRF Spectrometer – 50 mm² SDD

Bruker ELIO Portable Micro-XRF Spectrometer – 50 mm² SDD

The Bruker ELIO Portable Micro-XRF Spectrometer is a high-quality, portable micro-XRF solution for non-contact, non-destructive element analysis. This system is equipped with the large 50 mm² Silicon Drift Detector (SDD) and offers an analysis range from Na to U, with an analysis spot of just 1 mm.

The instrument was originally produced in 2018 and completely refurbished with original parts in 2024. In August 2026, Bruker performed major technical maintenance and refurbishment again. This included replacing the 50 mm² SDD detector and the power board, followed by approximately 24 hours of repair and final testing. In addition, the instrument is currently covered by a Bruker Annual Service Contract, valid from May 1, 2026, through April 30, 2027.

The ELIO is particularly suitable for applications where on-site analysis without damaging the object is essential. Examples include cultural heritage, conservation, archaeology, archaeometry, art authentication, materials research, and object analysis. Bruker positions the ELIO specifically for non-contact and non-destructive analysis, without the need for sample preparation. Key features

50 mm² SDD detector for high detection efficiency

Non-contact measurement

Non-destructive element analysis

1 mm analysis spot

Element range from Na (Z=11) to U (Z=92)

Helium purge for analysis of light elements starting from Na

Integrated video camera for accurate positioning

Laser guidance for determining the analysis point

Various X-ray filters for optimizing excitation conditions

Portable design for on-site analysis

Optional motorized XY mapping for areas up to 100 × 100 mm²

Suitable for both point measurements and element mapping

Technical specifications

Specification Bruker ELIO

Manufacturer Bruker

Model ELIO Portable Micro-XRF Spectrometer

Technology Micro-X-ray Fluorescence (Micro-XRF)

Detector 50 mm² SDD

Detector resolution <140 eV at Mn Kα

X-ray source Rh-target microfocus X-ray tube

Tube voltage 10–50 kV

Tube current 5–200 µA

Max. power 4 W

Collimator / analysis spot 1 mm

Analysis range Na–U

Helium purge Yes

Filters Filter kit, including Al, Ag, Cu, Ti

Analysis Point measurement and element mapping

Mapping area Up to 100 × 100 mm² with optional XY stage

Camera Integrated video/microscope camera

Software ELIO software + ESPRIT Reveal

Power supply 110/230 V ±10%, 50/60 Hz

Max. Power supply 66 W

Measuring head dimensions (W × D × H) 170 × 265 × 170 mm

Measuring head weight 2.1 kg

Tripod weight 4.3 kg

Tripod height adjustment 43–188 cm

Fine positioning stage 120 mm length

Production year 2018

Completely renewed 2024

Last major maintenance August 2026, performed by Bruker

Service contract May 1, 2026 – April 30, 2027

Included

Bruker ELIO measurement head

50 mm² SDD detector

Filter kit

Helium purge system

Video camera

Power supply

Pelican transport case

ELIO software

ESPRIT Reveal software

Mapping option

The ELIO can be expanded with a motorized XY stage for automated 1D and 2D element mapping over an area up to 100 × 100 mm. Whether this mapping hardware is included with this specific instrument is currently being confirmed.

Maintenance & Technical History

This unit offers a particularly interesting combination of an original instrument from 2018 and recent technical updates. The system was completely renewed in 2024 using original parts and underwent another extensive technical refurbishment by Bruker in August 2026. During this process, the 50 mm² SDD detector and power board were replaced, and the system was subsequently extensively tested.

The current Bruker Annual Service Contract, valid until April 30, 2027, offers additional security for the buyer.